Title :
Self-Consistent Electromagnetic–Thermal Model for Calculating the Temperature of a Ceramic Cylinder Irradiated by a High-Power Millimeter-Wave Beam
Author :
Fliflet, Arne W.
Author_Institution :
Div. of Plasma Phys., U.S. Naval Res. Lab., Washington, DC
fDate :
6/1/2008 12:00:00 AM
Abstract :
The high-power millimeter-wave beams that can be generated by CW gyrotrons represent a promising energy source for rapid high-temperature processing of materials. A program is under way at the Naval Research Laboratory to investigate the heating of ceramic tubes and cylinders using an 83-GHz beam for joining and sintering applications. In this paper, we discuss the scattering and absorption of microwave power by a ceramic cylinder and calculate the resulting temperature profile. The analysis accounts for the temperature dependence of the dielectric properties, an effect that can dramatically alter the microwave coupling during the heating process. In the process under investigation, the cylinder is rotated to promote azimuthally uniform heating so that only the radial dependence of the dielectric properties needs to be included.
Keywords :
ceramics; dielectric bodies; electromagnetic wave absorption; electromagnetic wave scattering; gyrotrons; heat conduction; joining processes; microwave heating; millimetre wave generation; pipes; radiation effects; rapid thermal processing; sintering; CW gyrotrons; Naval Research Laboratory; ceramic cylinder; ceramic tubes heating; dielectric losses; dielectric properties; frequency 83 GHz; heating process; high-power millimeter-wave beam irradiation; joining applications; microwave absorption; microwave coupling; microwave power scattering; rapid high-temperature processing; self-consistent electromagnetic-thermal model; sintering applications; Beams; Ceramics; Dielectric losses; Dielectric materials; Electromagnetic heating; Electromagnetic modeling; Gyrotrons; Materials processing; Plasma temperature; Temperature dependence; Ceramics; dielectric losses; electromagnetic heating; gyrotrons; material processing;
Journal_Title :
Plasma Science, IEEE Transactions on
DOI :
10.1109/TPS.2008.923755