Title :
Efficient Thermal via Planning Approach and Its Application in 3-D Floorplanning
Author :
Li, Zhuoyuan ; Hong, Xianlong ; Zhou, Qiang ; Zeng, Shan ; Bian, Jinian ; Yu, Wenjian ; Yang, Hannah H. ; Pitchumani, Vijay ; Cheng, Chung-Kuan
Author_Institution :
Comput. Sci. & Technol. Dept., Tsinghua Univ., Beijing
fDate :
4/1/2007 12:00:00 AM
Abstract :
In this paper, we investigate thermal via (T-via) planning during three-dimensional (3-D) floorplanning. First, we consider the temperature constrained T-via planning (TVP) problem on a given 3-D floorplan. Second, we integrate dynamic TVP into 3-D floorplanning process. Our main contribution and results can be summarized as follows. We solve the temperature constrained TVP problem by solving a sequence of simplified interlayer and intralayer TVP subproblems. Each subproblem is formulated as convex programming problem and we derive nearly optimal solution for detailed T-via distribution. Based on the TVP solution, we implement the integrated TVP and 3-D floorplanning algorithm in a two-stage approach. Before floorplanning, blocks are assigned into different layers by solving a sequence of knapsack problems. During floorplanning, T-vias are allocated with white space redistribution to optimize T-via insertion. Experimental results show that our TVP approach can reduce T-vias by 12% compared with a recent published work (J. Cong and Y. Zhang, "Thermal via planning for 3-D ICs," in Proc. Int. Conf. Comput.-Aided Des., Nov. 2005, pp.745-752). Compared with the postfloorplanning optimization approach, integrating TVP into floorplanning process can reduce T-vias by 16% with 21% runtime overhead
Keywords :
circuit optimisation; convex programming; integrated circuit interconnections; integrated circuit layout; 3D floorplanning; convex programming; temperature constrained T-via planning; thermal via planning; very large scale integration; white space redistribution; Computer science; Delay; Design automation; Design optimization; Integrated circuit interconnections; Integrated circuit technology; Temperature; Thermal conductivity; Thermal resistance; Very large scale integration; Floorplanning; optimization; thermal; very large scale integration (VLSI);
Journal_Title :
Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on
DOI :
10.1109/TCAD.2006.885831