DocumentCode :
747528
Title :
A Qualitative Event-Based Approach to Continuous Systems Diagnosis
Author :
Daigle, Matthew J. ; Koutsoukos, Xenofon D. ; Biswas, Gautam
Author_Institution :
NASA Ames Res. Center, Univ. of California, Moffett Field, CA
Volume :
17
Issue :
4
fYear :
2009
fDate :
7/1/2009 12:00:00 AM
Firstpage :
780
Lastpage :
793
Abstract :
Fault diagnosis is crucial for ensuring the safe operation of complex engineering systems. Although discrete-event diagnosis methods are used extensively, they do not easily address parametric fault isolation in systems with complex continuous dynamics. This paper presents a novel event-based approach for diagnosis of abrupt parametric faults in continuous systems, based on a qualitative abstraction of measurement deviations from the nominal behavior. From a continuous model of the system, we systematically derive dynamic fault signatures expressed as event-based fault models, which are used, in turn, for designing an event-based diagnoser of the system and determining system diagnosability. The proposed approach is applied to a subset of the Advanced Diagnostics and Prognostics Testbed, which is representative of a spacecraft´s electrical power system. We present experimental results from the actual testbed, as well as detailed simulation experiments that examine the performance of our diagnosis algorithms under different fault magnitudes and noise levels.
Keywords :
discrete event systems; fault diagnosis; power system faults; power system measurement; abrupt parametric faults; complex continuous dynamics; complex engineering systems; continuous model; continuous systems diagnosis; discrete event diagnosis; dynamic fault signatures; event based approach; event-based fault model; fault diagnosis; measurement deviations; parametric fault isolation; qualitative event-based approach; safe operation; Discrete-event system (DES); electrical power systems; model-based diagnosis;
fLanguage :
English
Journal_Title :
Control Systems Technology, IEEE Transactions on
Publisher :
ieee
ISSN :
1063-6536
Type :
jour
DOI :
10.1109/TCST.2008.2011648
Filename :
4837871
Link To Document :
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