DocumentCode :
747565
Title :
Quasi-monolithic toroidal cross-capacitor
Author :
Lee, Rae Duk ; Kim, Han Jun ; Semenov, Yu.P.
Author_Institution :
Korea Res. Inst. of Stand. & Sci., Daejeon, South Korea
Volume :
54
Issue :
2
fYear :
2005
fDate :
4/1/2005 12:00:00 AM
Firstpage :
538
Lastpage :
541
Abstract :
A quasi-monolithic toroidal cross-capacitor has been developed as an extremely stable and reliable capacitance standard of 0.5 pF. A geometrically symmetrical electrode structure is realized by using two identical plated substrates produced from fused silica with an exceedingly low thermal expansion coefficient. The capacitance instability expected after finishing the aging process does not exceed 5 × 10-8 per year. Investigations have shown that the capacitor developed for evaluation of the frequency dependence of the calculable cross-capacitor developed by Korea Research Institute of Standards and Science (KRISS), Daejeon, Korea, can be used as a substitute to maintain the capacitance unit, as well as a loss angle standard and a transfer standard to carry out intercomparisons.
Keywords :
capacitance measurement; capacitors; measurement standards; 0.5 pF; Daejeon; Korea; Korea Research Institute of Standards and Science; aging process; calculable cross-capacitor; capacitance instability; capacitance measurement; capacitance unit; frequency dependence; fused silica; geometrically symmetrical electrode; loss angle standard; quasimonolithic toroidal cross-capacitor; reliable capacitance standard; stable capacitance standard; thermal expansion coefficient; transfer standard; Capacitors; Circuits; Electrodes; Finishing; Frequency dependence; Quantum capacitance; Silicon compounds; Standards development; Thermal expansion; Uncertainty; Capacitance measurement; capacitors; frequency; losses; stability;
fLanguage :
English
Journal_Title :
Instrumentation and Measurement, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9456
Type :
jour
DOI :
10.1109/TIM.2004.843315
Filename :
1408228
Link To Document :
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