• DocumentCode
    747850
  • Title

    Correlation Metric for Generalized Feature Extraction

  • Author

    Fu, Yun ; Yan, Shuicheng ; Huang, Thomas S.

  • Author_Institution
    Beckman Inst. for Adv. Sci. & Technol., Univ. of Illinois at Urbana-Champaign, Urbana, IL
  • Volume
    30
  • Issue
    12
  • fYear
    2008
  • Firstpage
    2229
  • Lastpage
    2235
  • Abstract
    Beyond linear and kernel-based feature extraction, we propose in this paper the generalized feature extraction formulation based on the so-called graph embedding framework. Two novel correlation metric based algorithms are presented based on this formulation. correlation embedding analysis (CEA), which incorporates both correlational mapping and discriminating analysis, boosts the discriminating power by mapping data from a high-dimensional hypersphere onto another low-dimensional hypersphere and preserving the intrinsic neighbor relations with local graph modeling. correlational principal component analysis (CPCA) generalizes the conventional Principal Component Analysis (PCA) algorithm to the case with data distributed on a high-dimensional hypersphere. Their advantages stem from two facts: 1) tailored to normalized data, which are often the outputs from the data preprocessing step, and 2) directly designed with correlation metric, which shows to be generally better than Euclidean distance for classification purpose. Extensive comparisons with existing algorithms on visual classification experiments demonstrate the effectiveness of the proposed algorithms.
  • Keywords
    feature extraction; graph theory; pattern classification; principal component analysis; CEA; CPCA; Euclidean distance; PCA; correlation embedding analysis; correlation metric; correlational principal component analysis; data processing; generalized feature extraction; graph embedding; kernel-based feature extraction; principal component analysis; visual classification; Face and gesture recognition; Geometric; Machine learning; Algorithms; Artificial Intelligence; Biometry; Face; Image Enhancement; Image Interpretation, Computer-Assisted; Pattern Recognition, Automated; Reproducibility of Results; Sensitivity and Specificity; Statistics as Topic;
  • fLanguage
    English
  • Journal_Title
    Pattern Analysis and Machine Intelligence, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0162-8828
  • Type

    jour

  • DOI
    10.1109/TPAMI.2008.154
  • Filename
    4540102