DocumentCode :
747936
Title :
Manipulating single electrons with a seven-junction pump
Author :
Hof, Christian ; Jeanneret, Blaise ; Eichenberger, Ali ; Overney, Frédéric ; Keller, Mark W. ; Dalberth, M.J.
Author_Institution :
Swiss Fed. Office of Metrol. & Accreditation, Bern, Switzerland
Volume :
54
Issue :
2
fYear :
2005
fDate :
4/1/2005 12:00:00 AM
Firstpage :
670
Lastpage :
672
Abstract :
In this paper, the operation of a seven-junction electron pump is presented. To characterize the pump, a single-electron tunneling transistor capacitively coupled to the pump was used. With this device, single electrons were manipulated one at a time. By performing electron pumping at a frequency of 1 MHz, an error rate of (4±1)×10-5 was determined. This preliminary result is a solid milestone on the way to the capacitance standard presently under development at the Swiss Federal Office of Metrology and Accreditation.
Keywords :
Coulomb blockade; capacitance measurement; measurement standards; single electron transistors; tunnelling; 1 MHz; Coulomb blockade; Swiss Federal Office of Metrology and Accreditation; capacitance standard; electrical metrology; electron pumping; seven-junction electron pump; single-electron devices; single-electron tunneling transistor; Accreditation; Current measurement; Error analysis; Frequency; Metrology; NIST; Quantum capacitance; Single electron transistors; Standards development; Tunneling; Accuracy; Coulomb blockade; electrical metrology; electron pump; electron transistor; single-electron devices;
fLanguage :
English
Journal_Title :
Instrumentation and Measurement, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9456
Type :
jour
DOI :
10.1109/TIM.2004.843066
Filename :
1408260
Link To Document :
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