Radiation induced conduction in Kapton H film

Author

Yadlowsky, Edward J. ; Hazelton, Robert C.

Author_Institution

HY-Tech Res. Corp., Radford, VA, USA

Volume

35

Issue

4

fYear

1988

fDate

8/1/1988 12:00:00 AM

Firstpage

1050

Lastpage

1054

Abstract

The current-voltage characteristics of an 8-μm-thick Kapton-H sample irradiated by a 45-keV penetrating electron beam have been measured for a range of beam current densities (1-12 nA/cm²). The experimental results are consistent with a model which predicts the current to be dependent linearly on voltage at low voltage (ohmic regime), quadratically at intermediate voltages (space-charge-limited regime), and exponentially at higher voltages (trap-filled-limit regime). This model emphasizes the role of injected space charge and the filling traps in the forbidden band over field-dependent Poole-Frenkel and Schottky-barrier models proposed by others

Keywords

Poole-Frenkel effect; Schottky effect; electron beam effects; electron traps; electronic conduction in insulating thin films; polymer films; space-charge-limited conduction; 8 micron; Kapton H film; Schottky-barrier models; current-voltage characteristics; electron beam; exponentially; field-dependent Poole-Frenkel; filling traps; forbidden band; injected space charge; linearly; ohmic regime; quadratically; space-charge-limited regime; trap-filled-limit regime; Conductive films; Current density; Current measurement; Current-voltage characteristics; Density measurement; Electron beams; Filling; Low voltage; Predictive models; Space charge;

fLanguage

English

Journal_Title

Nuclear Science, IEEE Transactions on

Publisher

ieee

ISSN

0018-9499

Type

jour

DOI

10.1109/23.3702

Filename

3702