Title :
Timing Jitter Characterization for Mixed-Signal Production Test Using the Interpolation Algorithm
Author :
Xia, Tian ; Zheng, Hao
Author_Institution :
Sch. of Eng., Vermont Univ., Burlington, VT
fDate :
4/1/2007 12:00:00 AM
Abstract :
In this paper, a jitter measurement circuit for mixed-signal production test based on the interpolation algorithm is presented. By utilizing the limited sampling points per cycle, the original signal under test is reconstructed with a high accuracy. From the reconstructed signal, most timing jitter features can be characterized. To validate the design effectiveness, comparative studies have been performed between this jitter measurement method and other standard jitter characterization instruments
Keywords :
automatic test equipment; integrated circuit design; integrated circuit measurement; integrated circuit testing; interpolation; mixed analogue-digital integrated circuits; production testing; signal reconstruction; timing jitter; interpolation algorithm; measurement circuit; mixed-signal production test; sampling points; signal reconstruction; standard jitter characterization instruments; timing jitter; Built-in self-test; Circuit testing; Delay; Electronics industry; Instruments; Integrated circuit testing; Interpolation; Production; Sampling methods; Timing jitter; Interpolation algorithm; mixed signal; production test; timing jitter;
Journal_Title :
Industrial Electronics, IEEE Transactions on
DOI :
10.1109/TIE.2007.892257
