• DocumentCode
    748150
  • Title

    Improved scatter correction for SPECT images: a Monte Carlo study

  • Author

    Bong, Jung-Kyun ; Son, Hye-Kyung ; Lee, Jong Doo ; Kim, Hee-Joung

  • Author_Institution
    Dept. of Radiol., Yonsei Univ. Coll. of Med., Seoul, South Korea
  • Volume
    52
  • Issue
    5
  • fYear
    2005
  • Firstpage
    1263
  • Lastpage
    1270
  • Abstract
    We propose the extended triple energy window (ETEW) method that improves quantitation and contrast in SPECT images. ETEW is a modification of the triple energy window (TEW) method which corrects for scatter by using abutted scatter rejection windows, which can overestimate or underestimate scatter. ETEW is compared to TEW using Monte Carlo simulated data for point sources as well as hot and cold spheres in a cylindrical water phantom. Various main energy window widths were simulated. Both TEW and ETEW improved image contrast and recovery coefficients. Estimated scatter components by TEW were not proportional to the true scatter components when main energy window widths of 10%, 15%, and 20% were simulated. ETEW resulted in scatter that was directly proportional to the true scatter. ETEW improves image quantitation and quality of SPECT image data by more accurately correcting for scatter.
  • Keywords
    Monte Carlo methods; medical image processing; phantoms; single photon emission computed tomography; Monte Carlo simulated data; SPECT images; abutted scatter rejection windows; cold spheres; cylindrical water phantom; extended triple energy window method; hot sphere; image recovery coefficients; improved image contrast; improved scatter correction; triple energy window; Biomedical imaging; Convolution; Electromagnetic scattering; Filtering; Imaging phantoms; Low pass filters; Monte Carlo methods; Noise reduction; Particle scattering; Water resources; Energy window; SPECT; extended triple energy window (ETEW) scatter correction; triple energy window (TEW) scatter correction;
  • fLanguage
    English
  • Journal_Title
    Nuclear Science, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9499
  • Type

    jour

  • DOI
    10.1109/TNS.2005.858202
  • Filename
    1546404