DocumentCode
748181
Title
Neutron effects in high-power GaAs laser diodes
Author
Carson, R.F. ; Chow, W.W.
Author_Institution
Sandia Nat. Lab., Albuquerque, NM, USA
Volume
36
Issue
6
fYear
1989
fDate
12/1/1989 12:00:00 AM
Firstpage
2076
Lastpage
2082
Abstract
The radiation response of broad-area GaAs quantum-well laser diodes and arrays that emit up to 2 W from a 100-μm to 150-μm region at the front facet was tested. Results at neutron fluence levels up to 1015 n/cm2 are reported. The lasing threshold currents of these high-power GaAs laser diodes and arrays increased less than 40% after exposure to 1014 n/cm2 . Threshold current rose by 100% to 250%, and a possible increased susceptibility to facet damage was observed at 1015 n/cm2. The results indicate that the mechanisms for degradation are the same as those observed for the older semiconductor laser technologies
Keywords
III-V semiconductors; aluminium compounds; gallium arsenide; neutron effects; semiconductor device testing; semiconductor junction lasers; 2 W; Ga1-xAlxAs-GaAs; GaAs quantum well laser diodes; facet damage; high power laser diodes; lasing threshold currents; neutron effects; neutron fluence; radiation response; semiconductor; Degradation; Diode lasers; Gallium arsenide; Neutrons; Optical arrays; Quantum well lasers; Semiconductor diodes; Semiconductor laser arrays; Testing; Threshold current;
fLanguage
English
Journal_Title
Nuclear Science, IEEE Transactions on
Publisher
ieee
ISSN
0018-9499
Type
jour
DOI
10.1109/23.45407
Filename
45407
Link To Document