• DocumentCode
    748181
  • Title

    Neutron effects in high-power GaAs laser diodes

  • Author

    Carson, R.F. ; Chow, W.W.

  • Author_Institution
    Sandia Nat. Lab., Albuquerque, NM, USA
  • Volume
    36
  • Issue
    6
  • fYear
    1989
  • fDate
    12/1/1989 12:00:00 AM
  • Firstpage
    2076
  • Lastpage
    2082
  • Abstract
    The radiation response of broad-area GaAs quantum-well laser diodes and arrays that emit up to 2 W from a 100-μm to 150-μm region at the front facet was tested. Results at neutron fluence levels up to 1015 n/cm2 are reported. The lasing threshold currents of these high-power GaAs laser diodes and arrays increased less than 40% after exposure to 1014 n/cm2 . Threshold current rose by 100% to 250%, and a possible increased susceptibility to facet damage was observed at 1015 n/cm2. The results indicate that the mechanisms for degradation are the same as those observed for the older semiconductor laser technologies
  • Keywords
    III-V semiconductors; aluminium compounds; gallium arsenide; neutron effects; semiconductor device testing; semiconductor junction lasers; 2 W; Ga1-xAlxAs-GaAs; GaAs quantum well laser diodes; facet damage; high power laser diodes; lasing threshold currents; neutron effects; neutron fluence; radiation response; semiconductor; Degradation; Diode lasers; Gallium arsenide; Neutrons; Optical arrays; Quantum well lasers; Semiconductor diodes; Semiconductor laser arrays; Testing; Threshold current;
  • fLanguage
    English
  • Journal_Title
    Nuclear Science, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9499
  • Type

    jour

  • DOI
    10.1109/23.45407
  • Filename
    45407