DocumentCode :
748181
Title :
Neutron effects in high-power GaAs laser diodes
Author :
Carson, R.F. ; Chow, W.W.
Author_Institution :
Sandia Nat. Lab., Albuquerque, NM, USA
Volume :
36
Issue :
6
fYear :
1989
fDate :
12/1/1989 12:00:00 AM
Firstpage :
2076
Lastpage :
2082
Abstract :
The radiation response of broad-area GaAs quantum-well laser diodes and arrays that emit up to 2 W from a 100-μm to 150-μm region at the front facet was tested. Results at neutron fluence levels up to 1015 n/cm2 are reported. The lasing threshold currents of these high-power GaAs laser diodes and arrays increased less than 40% after exposure to 1014 n/cm2 . Threshold current rose by 100% to 250%, and a possible increased susceptibility to facet damage was observed at 1015 n/cm2. The results indicate that the mechanisms for degradation are the same as those observed for the older semiconductor laser technologies
Keywords :
III-V semiconductors; aluminium compounds; gallium arsenide; neutron effects; semiconductor device testing; semiconductor junction lasers; 2 W; Ga1-xAlxAs-GaAs; GaAs quantum well laser diodes; facet damage; high power laser diodes; lasing threshold currents; neutron effects; neutron fluence; radiation response; semiconductor; Degradation; Diode lasers; Gallium arsenide; Neutrons; Optical arrays; Quantum well lasers; Semiconductor diodes; Semiconductor laser arrays; Testing; Threshold current;
fLanguage :
English
Journal_Title :
Nuclear Science, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9499
Type :
jour
DOI :
10.1109/23.45407
Filename :
45407
Link To Document :
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