• DocumentCode
    748209
  • Title

    Photocurrent modeling at high dose rates

  • Author

    Ishaque, A.N. ; Howard, J.W. ; Becker, M. ; Block, R.C.

  • Author_Institution
    Gaerttner Linear Accel. Lab., Rensselaer Polytech. Inst., Troy, NY, USA
  • Volume
    36
  • Issue
    6
  • fYear
    1989
  • fDate
    12/1/1989 12:00:00 AM
  • Firstpage
    2092
  • Lastpage
    2098
  • Abstract
    An analytical steady-state photocurrent model that includes ohmic field effects and treats (nonlinear) ambipolar diffusion and nonlinear recombination effects explicitly is developed. The nonlinear recombination and ambipolar diffusion are solved exactly, and the asymptotic ohmic field is treated as an approximate perturbation with fitted parameters. The model is found to be in good agreement with numerical calculations and with experimental results. Appropriate Taylor series expansions and extensive parametric studies using the model indicate that the superlinear response is largest and occurs at smaller dose rates in relatively high-resistivity materials that have a long excess carrier lifetime and, if the material is n-type, a large τ nopo ratio. The nonlinearity is more pronounced for infinite-medium devices. For this reason, power devices are expected to exhibit more nonlinear behavior than integrated circuit devices
  • Keywords
    carrier lifetime; photoconductivity; radiation effects; semiconductor device models; semiconductor diodes; Taylor series expansions; analytical steady-state photocurrent model; asymptotic ohmic field; carrier lifetime; integrated circuit devices; nonlinear ambipolar diffusion; nonlinear recombination effects; numerical calculations; ohmic field effects; p-n junction device; p+-n power diode; power devices; semiconductor device; superlinear response; Charge carrier processes; Conductivity; Electron mobility; Equations; Laboratories; Linear accelerators; Photoconductivity; Power generation; Spontaneous emission; Steady-state;
  • fLanguage
    English
  • Journal_Title
    Nuclear Science, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9499
  • Type

    jour

  • DOI
    10.1109/23.45409
  • Filename
    45409