Title :
Circumvention of radiation-induced noise in CCD and CID imagers
Author :
Yates, George J. ; Turko, Bojan T.
Author_Institution :
Los Alamos Nat. Lab., NM, USA
fDate :
12/1/1989 12:00:00 AM
Abstract :
Measurements of radiation sensitivity for interline-transfer charge-coupled devices (CCDs) and charge-injection devices (CIDs) from irradiation with high-energy photons (60Co gamma rays and 3- to 5-MeV end-point bremsstrahlung) and 14-MeV neutrons are presented to establish imager susceptibility in such environments. Results from electronic clearing techniques designed for quick (≈300 μs for the CCDs and ≈10 μs for CIDs) removal (or dumping) of radiation-induced charge from prompt sources are discussed. Application of the techniques coupled with long-persistence (microsecond to millisecond) radiation-to-light converters for image retention are described. Typical data illustrating the effectiveness of charge clearing in removal of radiation noise are included for nanosecond-duration pulsed X-ray/γ-ray doses (50-mrad to 5-rad range) and microsecond-duration neutron fluences approaches 108 n/cm2
Keywords :
CCD image sensors; X-ray effects; gamma-ray effects; integrated circuit technology; neutron effects; radiation hardening (electronics); 10 to 300 mus; 5E-2 to 5 rad; 60Co; CCDs; CID imagers; CIDs; bremsstrahlung; charge-injection devices; electronic clearing techniques; gamma rays; high-energy photons; imager susceptibility; interline-transfer charge-coupled devices; neutrons; radiation-induced charge; radiation-induced noise; removal of radiation noise; Cameras; Charge coupled devices; Image converters; Ionizing radiation; Neutrons; Optical imaging; Optical scattering; TV; X-ray imaging; X-ray scattering;
Journal_Title :
Nuclear Science, IEEE Transactions on
