Title :
Prediction of EMI effects in operational amplifiers by a two-input Volterra series model
Author :
Fiori, F. ; Crovetti, P.S.
Author_Institution :
Electron. Dept., Politecnico di Torino, Turin, Italy
fDate :
6/6/2003 12:00:00 AM
Abstract :
The authors present a new analytical model that describes the nonlinear behaviour of common CMOS operational amplifiers excited by radio-frequency interference (RFI) added to the input nominal signals. The new model is a valid support to analogue integrated circuit designers since it expresses a relationship between circuit parameters, parasitic elements and the amplitude of the RFI induced output offset voltage of a feedback CMOS operational amplifier. The validity of model prediction has been verified through a comparison with experimental and computer simulation results.
Keywords :
CMOS analogue integrated circuits; Volterra series; electromagnetic interference; equivalent circuits; feedback amplifiers; nonlinear distortion; nonlinear network analysis; operational amplifiers; radiofrequency interference; transfer functions; EMI effects prediction; RFI induced output offset voltage; RFI-induced distortion; Volterra kernel description; analytical model; circuit parameters; design parameters; feedback CMOS opamps; negative feedback configuration; nonlinear behaviour; opamp design criteria; operational amplifiers; parasitic elements; radiofrequency interference; two-input Volterra series model;
Journal_Title :
Circuits, Devices and Systems, IEE Proceedings -
DOI :
10.1049/ip-cds:20030342
