Title :
High performance ferroelectric memory with grounded-plate PMOS-gate cell technology
Author_Institution :
Sch. of Electron. & Electr. Eng., Kyungpook Nat. Univ., Daegu, South Korea
fDate :
6/6/2003 12:00:00 AM
Abstract :
A new FRAM architecture utilising a grounded-plate PMOS-gate (GPPG) ferroelectric cell is proposed. A GPPG cell consists of a PMOS access transistor and a ferroelectric data storage capacitor. Its plate is grounded. The proposed architecture employs three novel methods for cell operation: a VDD-precharged bit-line, a negative-voltage word-line technique and negative-pulse restoration. Because this configuration does not need the plate control circuitry, it greatly increases the memory cell efficiency. In addition, unlike other reported common-plate cells, this scheme can supply a sufficient voltage of VDD to the ferroelectric capacitor while detecting and storing the polarisation on the cell. Thus, there is no restriction on low-voltage operation. Furthermore, by employing a compact column-path circuitry which only activates the required 8-bit data, this architecture minimises the current consumption of the memory array. A 2.5-V, 2-Mbit prototype chip has been developed with 0.5-μm CMOS technology, and the possibility of the realisation of GPPG cell architecture has been confirmed.
Keywords :
CMOS memory circuits; cellular arrays; ferroelectric capacitors; ferroelectric storage; 0.5 micron; 2 Mbit; 2.5 V; CMOS technology; FRAM architecture; FeRAM cell; PMOS access transistor; VDD-precharged bit-line; compact column-path circuitry; ferroelectric cell; ferroelectric data storage capacitor; grounded-plate PMOS-gate cell technology; high performance ferroelectric memory; memory array; negative-pulse restoration; negative-voltage word-line technique; plate control circuitry;
Journal_Title :
Circuits, Devices and Systems, IEE Proceedings -
DOI :
10.1049/ip-cds:20030351