Title :
Diode-pumped semiconductor disk laser with intracavity frequency doubling using lithium triborate (LBO)
Author :
Schiehlen, Eckart ; Golling, Matthias ; Unger, Peter
Author_Institution :
Dept. of Optoelectronics, Ulm Univ., Germany
fDate :
6/1/2002 12:00:00 AM
Abstract :
Diode-pumped semiconductor disk lasers, also referred to as vertical external cavity surface-emitting lasers show excellent beam characteristics in combination with high output powers. In this letter, we present a diode-pumped semiconductor disk laser based on the InAlGaAs material system without any additional phosphorus containing layers for strain compensation. We have achieved a near-infrared /spl lambda//spl sim/972-nm laser output power of 0.25 W in the fundamental transverse mode. The disk laser beam has been coupled into a single-mode fiber with a coupling efficiency of >70%. Moreover, we have shown 490-nm blue-green light generation by intracavity frequency doubling using lithium triborate (LBO).
Keywords :
III-V semiconductors; aluminium compounds; distributed Bragg reflector lasers; gallium arsenide; indium compounds; laser beams; laser cavity resonators; laser modes; lithium compounds; optical fibre couplers; optical harmonic generation; optical pumping; quantum well lasers; surface emitting lasers; 0.25 W; 490 nm; 70 percent; 972 nm; In/sub 0.2/Ga/sub 0.8/As; In/sub 0.2/Ga/sub 0.8/As quantum wells; InAlGaAs; InAlGaAs material system; LiB/sub 3/O/sub 5/; beam characteristics; blue-green light generation; coupling efficiency; diode-pumped semiconductor disk laser; disk laser beam; fundamental transverse mode; high output powers; intracavity frequency doubling; lithium triborate; near-infrared laser output power; single-mode fiber; strain compensation layers; vertical external cavity surface-emitting lasers; Fiber lasers; Frequency; Laser beams; Laser modes; Power generation; Power lasers; Semiconductor diodes; Semiconductor lasers; Surface emitting lasers; Vertical cavity surface emitting lasers;
Journal_Title :
Photonics Technology Letters, IEEE
DOI :
10.1109/LPT.2002.1003090