DocumentCode :
748789
Title :
Evaluation of nonuniform WDM source spacing for EDFA gain characterization
Author :
Kulkarni, Shamal ; Medberry, John ; Lear, Kevin L.
Author_Institution :
Agilent Technol., Loveland, CO, USA
Volume :
14
Issue :
6
fYear :
2002
fDate :
6/1/2002 12:00:00 AM
Firstpage :
783
Lastpage :
785
Abstract :
The accuracy of erbium-doped fiber amplifier gain characterization tests has been evaluated using reduced sets of wavelength-division-multiplexing laser sources. Wavelength grids with both uniform and nonuniform wavelength spacing have been evaluated. Experiments show that it is necessary to maintain equal spectral density of source power per region in order to operate at the same saturation/inversion conditions of the amplifier. By doing so, acceptable results were obtained for a laser configuration with 400-800-GHz nonuniform spacing, employing 12 lasers.
Keywords :
erbium; optical communication equipment; optical fibre amplifiers; optical hole burning; population inversion; wavelength division multiplexing; 400-800-GHz nonuniform spacing; ASE spectrum; EDFA gain characterization; WDM laser source reduced sets; accuracy; equal spectral density; erbium-doped fiber amplifier; nonuniform WDM source spacing; nonuniform wavelength spacing; saturation/inversion conditions; source power; spectral hole burning; uniform wavelength spacing; wavelength grids; Costs; Erbium-doped fiber amplifier; Erbium-doped fiber lasers; Laser noise; Optical amplifiers; Optical attenuators; Power amplifiers; Power measurement; System testing; Wavelength division multiplexing;
fLanguage :
English
Journal_Title :
Photonics Technology Letters, IEEE
Publisher :
ieee
ISSN :
1041-1135
Type :
jour
DOI :
10.1109/LPT.2002.1003092
Filename :
1003092
Link To Document :
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