• DocumentCode
    748898
  • Title

    Particle identification via pulse shape analysis for large-area silicon detectors of the CHIMERA array

  • Author

    Alderighi, M. ; Amorini, F. ; Anzalone, A. ; Arena, N. ; Auditore, L. ; Bassini, R. ; Boiano, C. ; Cardella, G. ; Cavallaro, S. ; Chatterjee, M.B. ; D´Andrea, M. ; De Filippo, E. ; Fichera, F. ; Geraci, E. ; Giustolisi, F. ; Guardone, N. ; Grimaldi, A. ;

  • Author_Institution
    Inst. Nazionale di Fisica Nucl., Milano, Italy
  • Volume
    52
  • Issue
    5
  • fYear
    2005
  • Firstpage
    1624
  • Lastpage
    1629
  • Abstract
    Mass and atomic-number identification (ID) of reaction products is a fundamental requirement of any nuclear reaction study. An effective particle-ID method is demonstrated, based on pulse shape analysis/discrimination (PSD) applied to large-area, single-element silicon detectors. This technique uses commercial electronic modules and achieves atomic number resolution rivaling that typically obtained with multi-element (ΔE-E) detector telescopes. The method is applied to the CHIMERA detector system without compromising its time-of-flight (TOF) resolution. In-beam tests of the PSD method have been performed with large-area, 300-μm thick CHIMERA silicon detectors, measuring particles from the 19F+12C reaction at Tandem energies. Performance of a simple PSD set up is discussed, for front and rear particle injection.
  • Keywords
    heavy ion-nucleus reactions; nuclear electronics; pulse shaping circuits; silicon radiation detectors; 19F(12C,X); CHIMERA silicon detectors; Tandem energies; atomic-number identification; commercial electronic modules; in-beam tests; mass identification; multielement detector telescopes; nuclear reaction; particle-ID method; pulse shape analysis; pulse shape discrimination; reaction products; single-element silicon detectors; time-of-flight resolution; Atomic measurements; Detectors; Nuclear electronics; Performance evaluation; Pulse shaping methods; Sensor arrays; Shape; Silicon; Telescopes; Testing; Charge identification; planar silicon detector; pulse shape;
  • fLanguage
    English
  • Journal_Title
    Nuclear Science, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9499
  • Type

    jour

  • DOI
    10.1109/TNS.2005.856991
  • Filename
    1546474