Title :
Timing optimization by gate resizing and critical path identification
Author :
Fang, Chen-Liang ; Jone, Wen-Ben
Author_Institution :
Dept. of Comput. Sci., Jin-Wen Coll., Taipei, Taiwan
fDate :
2/1/1995 12:00:00 AM
Abstract :
Due to the rapid progress in VLSI technology, the overall complexity of the chip has increased dramatically. There is a simultaneous need for more functions and higher speed in modern VLSI engineering. Therefore, use of a minimum amount of extra hardware to meet timing requirements is becoming a major issue in VLSI design. Here, we propose an efficient method for timing optimization using gate resizing. To control the hardware overhead, a minimum (or as small as possible) number of gates are selected for resizing with the aid of a powerful benefit function. To guarantee the performance of timing optimization, a modified version of PODEM, called τPODEM, ensures that each resized gate is located on at least one critical path. Thus, resizing a gate definitively reduces circuit delay. Simulation results demonstrate that our timing optimization method can efficiently reduce circuit delay with a limited amount of gate resizing
Keywords :
VLSI; circuit optimisation; delays; integrated circuit layout; logic CAD; logic arrays; timing; τPODEM; VLSI technology; benefit function; circuit delay; critical path identification; design verification; digital ICs; gate resizing; hardware overhead; timing optimization; Circuit simulation; Computer science; Digital circuits; Fabrication; Hardware; Optimization methods; Propagation delay; Semiconductor device manufacture; Timing; Very large scale integration;
Journal_Title :
Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on