DocumentCode :
749416
Title :
Functional characterization of a high-gain BJT radiation detector
Author :
Batignani, Giovanni ; Bettarini, Stefano ; Bondioli, Mario ; Boscardin, Maurizio ; Bosisio, Luciano ; Betta, Gian-Franco Dalla ; Dittongo, Selenia ; Forti, Francesco ; Giacomini, Gabriele ; Giorgi, Marcello A. ; Gregori, Paolo ; Piemonte, Claudio ; Rachev
Author_Institution :
Dept. of Phys., "E. Fermi," Univ. of Pisa, With Pisa, Italy
Volume :
52
Issue :
5
fYear :
2005
Firstpage :
1882
Lastpage :
1886
Abstract :
n-p-n bipolar phototransistors have been designed and fabricated on high-resistivity silicon substrates. A technology featuring a double implant for the emitter allowed us to obtain a typical current gain of about 600. The device has been tested with α particles from a 239Pu source, β particles from 90Sr, and X-rays from 241Am using a simple experimental setup, where the detector is directly connected to the oscilloscope. In the case of electrons, pulse heights of 100 mV have been observed, with pulse length of 50 μs, measured on a load resistor in series to the emitter. The parameters driving the time performance have been measured, obtaining a good agreement with the electrical model of the device. We report on the functional characterization of the device, in particular the time response, the energy calibration, and the electronic noise measurement.
Keywords :
X-ray detection; alpha-particle detection; beta-ray detection; bipolar transistors; nuclear electronics; phototransistors; silicon radiation detectors; 239Pu source; 241Am; 90Sr; X-rays; beta particles; current gain; electronic noise measurement; energy calibration; high-resistivity silicon substrates; load resistor; n-p-n bipolar phototransistors; pulse heights; silicon radiation detector; time performance; time response; Implants; Oscilloscopes; Phototransistors; Pulse measurements; Radiation detectors; Silicon; Strontium; Testing; X-ray detection; X-ray detectors; Bipolar transistor amplifiers; phototransistors; silicon radiation detectors;
fLanguage :
English
Journal_Title :
Nuclear Science, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9499
Type :
jour
DOI :
10.1109/TNS.2005.856914
Filename :
1546521
Link To Document :
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