• DocumentCode
    750225
  • Title

    Low-Noise and High-Frequency Resolution Electrooptic Sensing of RF Near-Fields Using an External Optical Modulator

  • Author

    Sasagawa, Kiyotaka ; Tsuchiya, Masahiro

  • Author_Institution
    Nat. Inst. of Inf. & Commun. Technol., Tokyo
  • Volume
    26
  • Issue
    10
  • fYear
    2008
  • fDate
    5/15/2008 12:00:00 AM
  • Firstpage
    1242
  • Lastpage
    1248
  • Abstract
    We developed an electrooptic (EO) sensing system using an external optical intensity modulator for radio frequency (RF) electric near-field measurements. This low-noise, high-frequency resolution system is based on the photonic heterodyning technique in which a RF near-field signal is mixed with modulated light by an EO crystal and downconverted to the difference frequency. Because the optical modulator has a bandwidth extending from DC to several gigahertz, the frequency resolution of this system is determined by that of the RF synthesizer it uses. The intensity noise of the modulated light is quite low, and the noise level of the EO signal can be reduced to almost the shot-noise level by using a balanced detection scheme.
  • Keywords
    electric sensing devices; electro-optical modulation; heterodyne detection; intensity modulation; optical sensors; balanced detection; electric near-field measurements; electrooptic crystal; electrooptic sensing; external optical modulator; high-frequency resolution sensing; intensity modulator; intensity noise; low-noise sensing; photonic heterodyning; radiofrequency near-fields; shot-noise level; Electrooptic modulators; Intensity modulation; Noise level; Optical mixing; Optical modulation; Optical noise; Optical sensors; Photonic crystals; Radio frequency; Signal resolution; Electromagnetic field measurement; Pockels effect; electrooptic (EO) sensor; optical modulator; photonic heterodyning;
  • fLanguage
    English
  • Journal_Title
    Lightwave Technology, Journal of
  • Publisher
    ieee
  • ISSN
    0733-8724
  • Type

    jour

  • DOI
    10.1109/JLT.2008.917036
  • Filename
    4542913