DocumentCode
75056
Title
Efficiency Droop Improvement in InGaN/GaN Light-Emitting Diodes by Graded-Composition Multiple Quantum Wells
Author
Li-Hong Zhu ; Wei Liu ; Fan-Ming Zeng ; Yu-Lin Gao ; Bao-Lin Liu ; Yi-Jun Lu ; Zhong Chen
Author_Institution
Dept. of Electron. Sci., Xiamen Univ., Xiamen, China
Volume
5
Issue
2
fYear
2013
fDate
Apr-13
Firstpage
8200208
Lastpage
8200208
Abstract
InGaN/GaN light-emitting diodes (LEDs) with a graded-composition multiple quantum well (GQW) were designed not only to investigate the effect of polarization field on the efficiency droop in InGaN/GaN multiple quantum wells (MQWs) but to find out possible solutions to prevent or reduce the efficiency droop in GaN-based LEDs as well. Pulsed electroluminescence measurement, to avoid heating effects partly, revealed that the output intensity peak occurs at ~280A/cm2 current density for the GQW structure, whereas for a conventional structure, it occurs at a much lower current density of ~150A/cm2. The relative quantum efficiency indicates that the efficiency droop in GQW LEDs was reduced effectively due to the reduction in polarization field in the active layer. In the test GQW structure with inverse indium composition variation direction, electrons escape from the active region, which is in company with rapid saturation of output power and decrease in efficiency observed at high current density. It indicates that at high current density, the electron leakage is obvious. These results suggest that the polarization field in the active layer and the consequent electron leakage are probably the main mechanism responsible for the efficiency droop at high current injection levels.
Keywords
III-V semiconductors; electroluminescence; gallium compounds; indium compounds; light emitting diodes; semiconductor quantum wells; wide band gap semiconductors; InGaN-GaN; LED; MQW; current density; efficiency droop improvement; electron leakage; graded-composition multiple quantum wells; light-emitting diodes; multiple quantum wells; polarization field effect; pulsed electroluminescence measurement; Charge carrier processes; Current density; Gallium nitride; Indium; Light emitting diodes; Power generation; Quantum well devices; InGaN/GaN multiple quantum well (MQW); Metal–organic chemical vapor deposition (MOCVD); efficiency droop; electron leakage;
fLanguage
English
Journal_Title
Photonics Journal, IEEE
Publisher
ieee
ISSN
1943-0655
Type
jour
DOI
10.1109/JPHOT.2013.2245881
Filename
6472041
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