• DocumentCode
    750687
  • Title

    Thin-film decoupling capacitors for multichip modules

  • Author

    Dimos, Duane ; Lockwood, Steven J. ; Schwartz, Robert W. ; Rodgers, M. Steven

  • Author_Institution
    Sandia Nat. Labs., Albuquerque, NM, USA
  • Volume
    18
  • Issue
    1
  • fYear
    1995
  • fDate
    3/1/1995 12:00:00 AM
  • Firstpage
    174
  • Lastpage
    179
  • Abstract
    Thin-film decoupling capacitors based on ferroelectric lead lanthanum zirconate titanate (PLZT) films are being developed for use in advanced packages, such as multichip modules. These thin-film decoupling capacitors are intended to replace multilayer ceramic capacitors for certain applications, since they can be more fully integrated into the packaging architecture. The increased integration that can be achieved should lead to decreased package volume and improved highspeed performance, due to a decrease in interconnect inductance. PLZT films are fabricated by spin coating using metal carboxylate/alkoxide solutions. These films exhibit very high dielectric constants (ε⩾900), low dielectric losses (tan δ≈0.01), excellent insulation resistances (ρ>1013 Ω-cm at 125°C), and good breakdown field strengths (EB≈900 kV/cm). For integrated circuit applications, the PLZT dielectric is less than 1 μm thick, which results in a large capacitance/area (8-9 nF/mm 2). The thin-film geometry and processing conditions also make these capacitors suitable for direct incorporation onto integrated circuits and for packages that require embedded components
  • Keywords
    dielectric losses; electric strength; ferroelectric capacitors; ferroelectric thin films; integrated circuit packaging; lanthanum compounds; lead compounds; multichip modules; permittivity; piezoceramics; thin film capacitors; 125 degC; PLZT; PLZT dielectric; PLZT films; PbLaZrO3TiO3; breakdown field strengths; dielectric constants; dielectric losses; embedded components; insulation resistances; integrated circuit applications; interconnect inductance; metal carboxylate/alkoxide solutions; multichip modules; package volume; packaging architecture; processing conditions; spin coating; thin-film decoupling capacitors; Capacitors; Dielectric losses; Ferroelectric films; Ferroelectric materials; Lanthanum; Multichip modules; Nonhomogeneous media; Packaging; Titanium compounds; Transistors;
  • fLanguage
    English
  • Journal_Title
    Components, Packaging, and Manufacturing Technology, Part A, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    1070-9886
  • Type

    jour

  • DOI
    10.1109/95.370752
  • Filename
    370752