DocumentCode

751601

Title

A strategy for mixed-signal yield improvement

Author

Bordelon, Jim ; Tranchina, Ben ; Madangarli, Vipin ; Craig, Mark

Author_Institution

HPL Technologies

Volume

19

Issue

3

fYear

2002

Firstpage

12

Lastpage

21

Keywords

Circuit faults; Circuit noise; Circuit testing; Costs; Data analysis; Error correction; Optical films; Prototypes; Radio frequency; Vehicles;

fLanguage

English

Journal_Title

Design & Test of Computers, IEEE

Publisher

ieee

ISSN

0740-7475

Type

jour

DOI

10.1109/MDT.2002.1003783

Filename

1003783