DocumentCode :
751601
Title :
A strategy for mixed-signal yield improvement
Author :
Bordelon, Jim ; Tranchina, Ben ; Madangarli, Vipin ; Craig, Mark
Author_Institution :
HPL Technologies
Volume :
19
Issue :
3
fYear :
2002
Firstpage :
12
Lastpage :
21
Keywords :
Circuit faults; Circuit noise; Circuit testing; Costs; Data analysis; Error correction; Optical films; Prototypes; Radio frequency; Vehicles;
fLanguage :
English
Journal_Title :
Design & Test of Computers, IEEE
Publisher :
ieee
ISSN :
0740-7475
Type :
jour
DOI :
10.1109/MDT.2002.1003783
Filename :
1003783
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=751601
