Title :
Embedded timing analysis: a soc infrastructure
Author :
Tabatabaei, Sassan ; Ivanov, André
Author_Institution :
Vector 12 Corporation
Keywords :
Circuit testing; Delay effects; Delay estimation; Frequency measurement; Jitter; Sampling methods; Signal resolution; Time domain analysis; Time measurement; Timing;
Journal_Title :
Design & Test of Computers, IEEE
DOI :
10.1109/MDT.2002.1003786
