DocumentCode :
751706
Title :
Nondestructive defect identification with terahertz time-of-flight tomography
Author :
Zhong, Hua ; Xu, Jingzhou ; Xie, Xu ; Yuan, Tao ; Reightler, Ron ; Madaras, Eric ; Zhang, Xi-Cheng
Author_Institution :
Center for Terahertz Res., Rensselaer Polytech. Inst., Troy, NY, USA
Volume :
5
Issue :
2
fYear :
2005
fDate :
4/1/2005 12:00:00 AM
Firstpage :
203
Lastpage :
208
Abstract :
We demonstrate the application of terahertz (THz) time-of-flight tomographic imaging to identify the distribution of defects in foam materials. Based on THz time-domain spectroscopy technology, THz imaging probes targets with picosecond pulses of broad-band radiation in the frequency range from 100 GHz to 3 THz. The reflected THz wave from the target is measured using electrooptic sampling, which provides two-dimensional images with phase and amplitude information, as well as the spectroscopic properties of the object. The depth information is recorded in the THz time-domain waveform. Several reconstruction models are developed for tomographic imaging of defects inside foam. Foam insulation of space shuttle fuel tanks, with prebuilt defects, are investigated with THz tomographic imaging. Most prebuilt defects are pinpointed and models used to identify different kinds of defects are discussed.
Keywords :
defect states; electro-optical effects; flaw detection; foams; image reconstruction; insulating materials; submillimetre wave imaging; submillimetre wave measurement; time of flight spectroscopy; tomography; 0.1 to 3 THz; 2D images; THz imaging probes; THz time-domain spectroscopy technology; THz time-domain waveform; THz tomographic imaging; THz wave reflection; amplitude information; broad-band radiation; defect distribution; depth information; electrooptic sampling; foam insulation; foam materials; nondestructive defect identification; phase information; picosecond pulse; prebuilt defects; space shuttle fuel tanks; spectroscopic properties; terahertz imaging; terahertz time-of-flight tomography; Frequency; Image reconstruction; Image sampling; Optical imaging; Phase measurement; Probes; Spectroscopy; Submillimeter wave technology; Time domain analysis; Tomography; Nondestructive identification; THz technology; THz time-domain spectroscopy; terahertz (THz) imaging; time-of-flight (TOF); tomography;
fLanguage :
English
Journal_Title :
Sensors Journal, IEEE
Publisher :
ieee
ISSN :
1530-437X
Type :
jour
DOI :
10.1109/JSEN.2004.841341
Filename :
1411797
Link To Document :
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