DocumentCode :
751720
Title :
IP for embedded diagnosis
Author :
Pateras, Stephen
Author_Institution :
LogicVision
Volume :
19
Issue :
3
fYear :
2002
Firstpage :
44
Lastpage :
53
Keywords :
Built-in self-test; Circuit testing; Counting circuits; Debugging; Fault diagnosis; Flip-flops; Logic; Pins; Signal generators; Test pattern generators;
fLanguage :
English
Journal_Title :
Design & Test of Computers, IEEE
Publisher :
ieee
ISSN :
0740-7475
Type :
jour
DOI :
10.1109/MDT.2002.1003795
Filename :
1003795
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=751720
