DocumentCode

751720

Title

IP for embedded diagnosis

Author

Pateras, Stephen

Author_Institution

LogicVision

Volume

19

Issue

3

fYear

2002

Firstpage

44

Lastpage

53

Keywords

Built-in self-test; Circuit testing; Counting circuits; Debugging; Fault diagnosis; Flip-flops; Logic; Pins; Signal generators; Test pattern generators;

fLanguage

English

Journal_Title

Design & Test of Computers, IEEE

Publisher

ieee

ISSN

0740-7475

Type

jour

DOI

10.1109/MDT.2002.1003795

Filename

1003795