Title :
Embedded robustness IPs for transient-error-free ICs
Author :
Dupont, Eric ; Nicolaidis, Michael ; Rohr, Peter
Author_Institution :
iRoC Technologies
Keywords :
Atomic measurements; Cosmic rays; Neutrons; Protection; Robustness; Sea level; Sea surface; Semiconductor devices; Semiconductor materials; Very large scale integration;
Journal_Title :
Design & Test of Computers, IEEE
DOI :
10.1109/MDT.2002.1003798
