DocumentCode :
751794
Title :
DFT and BIST of a multichip module for high-energy physics experiments
Author :
Benso, Alfredo ; Chiusano, Silvia ; Prinetto, Paolo
Author_Institution :
Politecnico di Torino, Italy
Volume :
19
Issue :
3
fYear :
2002
Firstpage :
92
Lastpage :
103
Abstract :
Engineers at Politecnico di Torino designed a multichip module for high-energy physics experiments conducted on the Large Hadron Collider. An array of these MCMs handles multichannel data acquisition and signal processing. Testing the MCM from board to die level required a combination of DFT strategies
Keywords :
application specific integrated circuits; boundary scan testing; built-in self test; colliding beam accelerators; data acquisition; design for testability; field programmable gate arrays; high energy physics instrumentation computing; multichip modules; nuclear electronics; particle calorimetry; readout electronics; silicon radiation detectors; storage rings; synchrotrons; ASIC; BIST; Compact Muon Solenoid experiment; DFT strategies; FPGA-based test processor; Large Hadron Collider; board to die level testing; boundary scan logic; calorimetric readout system; design reusability; electromagnetic calorimeter; functional chip test; high-energy physics experiments; horizontal reuse; interconnect tests; multichannel data acquisition; multichannel signal processing; multichip module; online testing; readout systems; silicon detectors; vertical reuse; Built-in self-test; Data acquisition; Design for testability; Detectors; Mesons; Multichip modules; Optical fibers; Physics; Poles and towers; Solenoids;
fLanguage :
English
Journal_Title :
Design & Test of Computers, IEEE
Publisher :
ieee
ISSN :
0740-7475
Type :
jour
DOI :
10.1109/MDT.2002.1003804
Filename :
1003804
Link To Document :
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