DocumentCode :
752072
Title :
High-temperature operation of oxide SFQ-circuit-elements
Author :
Tsubone, Koji ; Wakana, Hironori ; Ishimaru, Yoshihiro ; Adachi, Seiji ; Nakayama, Kohei ; Tarutani, Yoshinobu ; Tanabe, Keiichi
Author_Institution :
Int. Supercond. Technol. Center, Supercond. Res. Lab., Tokyo, Japan
Volume :
15
Issue :
4
fYear :
2005
Firstpage :
3911
Lastpage :
3916
Abstract :
Single flux quantum (SFQ) circuit components such as an SFQ-dc converter and a confluence buffer have been fabricated by using an YBa2Cu3O7-δ ramp-edge junction technology and their logic operations at temperatures up to near 60 K were investigated. The SFQ-dc converter was correctly operated in a wide temperature range from 4.2 K to 56 K and found to be useful for detecting output signals from other SFQ circuit components at any operating temperatures. The basic function that a signal from either of two input Josephson transmission lines (JTLs) was transmitted to an output JTL was confirmed for the confluence buffer and finite operating margins were obtained at temperatures from 42 K to 61 K. The narrowest margin of dc supply current obtained at temperatures from 55 K to 60 K was ±20% and was consistent with the simulation. Margin reduction due to thermal noise was also evaluated. According to the analytical calculation, the operating margin to keep the bit-error rate less than 10-5 was as large as ±20% even at 50 K when the value of junction critical-current Ic was kept near 0.4 mA.
Keywords :
barium compounds; convertors; high-temperature superconductors; high-temperature techniques; superconducting logic circuits; thermal noise; yttrium compounds; 4.2 to 56 K; 42 to 61 K; Josephson transmission lines; YBa2Cu3O7-δ; YBa2Cu3O7-δ ramp-edge junction; finite operating margins; high-temperature operation; logic operations; oxide single flux quantum circuit; single flux quantum-dc converter; thermal noise; Circuit noise; Electrodes; High temperature superconductors; Josephson junctions; Logic circuits; Noise reduction; Superconducting device noise; Superconducting thin films; Temperature distribution; Thin film circuits; Confluence buffer; YBa; operating margin; oxide single flux quantum (SFQ) circuit; single flux quantum (SFQ)-dc converter; thermal noise;
fLanguage :
English
Journal_Title :
Applied Superconductivity, IEEE Transactions on
Publisher :
ieee
ISSN :
1051-8223
Type :
jour
DOI :
10.1109/TASC.2005.859045
Filename :
1549921
Link To Document :
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