• DocumentCode
    752590
  • Title

    Further statistical studies of ionization growth and breakdown formation mechanisms in the final breakdown phase of a transient hollow cathode discharge

  • Author

    Moreno, Josè ; Zambra, Marcelo ; Favre, Mario

  • Author_Institution
    Comision Chilena de Energia Nucl., Santiago, Chile
  • Volume
    30
  • Issue
    1
  • fYear
    2002
  • fDate
    2/1/2002 12:00:00 AM
  • Firstpage
    417
  • Lastpage
    422
  • Abstract
    A transient hollow cathode discharge (THCD) is a high-voltage low-pressure discharge, which is characterized by an axial hollow in the cathode electrode. The temporal sequence of the different parts of ionization growth in breakdown formation, which take place just before electric breakdown, are statistically studied. The von Lane formalism has been used to characterize in detail the statistical time distribution of the different processes required for electric breakdown to occur. The experiments have been performed in Hydrogen at pressure between 13.3 and 53.2 Pa, with different sizes of the cathode aperture. It has been found that the different processes of ionization growth and breakdown formation mechanisms involved in the sequence leading to breakdown are not associated with a single characteristic time. Time-shifted Gaussian distribution functions have been identified which, when added together, reproduce the cumulative time distribution for each observed event, especially at low pressure and smaller cathode aperture, where the hollow cathode effect is less effective
  • Keywords
    glow discharges; ionisation; statistical analysis; breakdown formation; breakdown formation mechanisms; cathode aperture; cumulative time distribution; electric breakdown; high-voltage low-pressure discharge; ionization growth; statistical studies; statistical time distribution; time-shifted Gaussian distribution functions; transient hollow cathode discharge; von Lane formalism; Anodes; Apertures; Breakdown voltage; Cathodes; Delay effects; Electric breakdown; Electrons; Gaussian distribution; Ionization; Statistical distributions;
  • fLanguage
    English
  • Journal_Title
    Plasma Science, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0093-3813
  • Type

    jour

  • DOI
    10.1109/TPS.2002.1003890
  • Filename
    1003890