DocumentCode :
752660
Title :
Two-dimensional symmetric multimode interferences in silicon square waveguides
Author :
Hui Chen ; Tong, D.T.K.
Author_Institution :
Dept. of Electr. & Electron. Eng., Hong Kong Univ. of Sci. & Technol., China
Volume :
17
Issue :
4
fYear :
2005
fDate :
4/1/2005 12:00:00 AM
Firstpage :
801
Lastpage :
803
Abstract :
Symmetric interference in two-dimensional multimode silicon waveguides is experimentally investigated. For a 100×100 μm2 cross section, 2700-μm-long waveguide fabricated on silicon-on-insulator substrate, an 8×8 matrix of replicated images with high contrast ratio is demonstrated for 1530-1570 nm wavelength range. Symmetric interference results in reduced device length, and the actual device length is consistent with the theoretical expectation. The device also exhibits stable imaging in terms of good loss uniformity, and low wavelength and polarization dependencies among the replicated images.
Keywords :
elemental semiconductors; integrated optics; light interference; light polarisation; optical design techniques; optical fabrication; optical images; optical losses; optical waveguides; silicon; 1530 to 1570 nm; 2700 mum; Si; loss uniformity; polarization; silicon square waveguides; silicon-on-insulator substrate; two-dimensional symmetric multimode interferences; Interference; Optical device fabrication; Optical devices; Optical imaging; Optical polarization; Optical waveguides; Refractive index; Silicon on insulator technology; Symmetric matrices; Transmission line matrix methods; Integrated optics; multimode interference (MMI); optical power splitters;
fLanguage :
English
Journal_Title :
Photonics Technology Letters, IEEE
Publisher :
ieee
ISSN :
1041-1135
Type :
jour
DOI :
10.1109/LPT.2004.843257
Filename :
1411881
Link To Document :
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