Title :
Two-dimensional symmetric multimode interferences in silicon square waveguides
Author :
Hui Chen ; Tong, D.T.K.
Author_Institution :
Dept. of Electr. & Electron. Eng., Hong Kong Univ. of Sci. & Technol., China
fDate :
4/1/2005 12:00:00 AM
Abstract :
Symmetric interference in two-dimensional multimode silicon waveguides is experimentally investigated. For a 100×100 μm2 cross section, 2700-μm-long waveguide fabricated on silicon-on-insulator substrate, an 8×8 matrix of replicated images with high contrast ratio is demonstrated for 1530-1570 nm wavelength range. Symmetric interference results in reduced device length, and the actual device length is consistent with the theoretical expectation. The device also exhibits stable imaging in terms of good loss uniformity, and low wavelength and polarization dependencies among the replicated images.
Keywords :
elemental semiconductors; integrated optics; light interference; light polarisation; optical design techniques; optical fabrication; optical images; optical losses; optical waveguides; silicon; 1530 to 1570 nm; 2700 mum; Si; loss uniformity; polarization; silicon square waveguides; silicon-on-insulator substrate; two-dimensional symmetric multimode interferences; Interference; Optical device fabrication; Optical devices; Optical imaging; Optical polarization; Optical waveguides; Refractive index; Silicon on insulator technology; Symmetric matrices; Transmission line matrix methods; Integrated optics; multimode interference (MMI); optical power splitters;
Journal_Title :
Photonics Technology Letters, IEEE
DOI :
10.1109/LPT.2004.843257