DocumentCode :
752689
Title :
Test cost reduction through compression
Author :
Gonciari, P. ; Al-Hashimi, Bashir ; Nicolici, Nicola
Author_Institution :
University of Southampton
Volume :
1
Issue :
3
fYear :
2003
Firstpage :
37
Lastpage :
41
fLanguage :
English
Journal_Title :
Electronics Systems and Software
Publisher :
iet
ISSN :
1479-8336
Type :
jour
Filename :
1215787
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=752689
