DocumentCode :
75274
Title :
A Study on Network Analyzer Self-Calibration Using an Arbitrary Device
Author :
Chih-Jung Chen
Author_Institution :
Dept. of Commun., Navig., & Control Eng., Nat. Taiwan Ocean Univ., Keelung, Taiwan
Volume :
62
Issue :
9
fYear :
2013
fDate :
Sept. 2013
Firstpage :
2576
Lastpage :
2582
Abstract :
This paper studies the feasibility of calibrating a vector network analyzer with an arbitrary device serving as a calibration standard. The short-open-load-reciprocal and thru-attenuator-network (TAN) procedures are, respectively, extended to develop short-open-load-device and thru-attenuator-device algorithms. The developed algorithms eliminate the limitations and broaden the applicable range of the thru-open-load-reciprocal and TAN procedures by using the device under test as a transfer standard. To benchmark the developed algorithms against the thru-reflect-line algorithm, experiments are conducted with a nonreciprocal device having theoretically symmetrical reflections. Results of the experiments verify the applicability of the developed algorithms.
Keywords :
calibration; network analysers; transfer standards; TAN; arbitrary device; device under test; nonreciprocal device; self-calibration standard; short-open-load-device algorithm; short-open-load-reciprocal procedure; thru-attenuator-device algorithm; thru-attenuator-network procedure; thru-reflect-line algorithm; transfer standard; vector network analyzer; Scattering parameters; self-calibration; short-open-load-reciprocal; thru-attenuator-network; thru-line-reflect; vector network analyzer;
fLanguage :
English
Journal_Title :
Instrumentation and Measurement, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9456
Type :
jour
DOI :
10.1109/TIM.2013.2258768
Filename :
6519318
Link To Document :
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