DocumentCode :
752818
Title :
NSOM-based characterization method applicable to optical channel waveguide with a solid-state cladding
Author :
Ji, Wonsoo ; Kim, Daechan ; Kim, Hyun Jun ; O, Beom-Hoan ; Park, Se-Geun ; Lee, El-Hang ; Lee, Seung Gol
Author_Institution :
Sch. of Inf. & Commun. Eng., INHA Univ., Inchon, South Korea
Volume :
17
Issue :
4
fYear :
2005
fDate :
4/1/2005 12:00:00 AM
Firstpage :
846
Lastpage :
848
Abstract :
A new characterization method employing near-field scanning optical microscope (NSOM) is proposed to measure the propagation characteristics of an optical channel waveguide having a solid-state cladding. For the measurement, the cladding material is replaced with the liquid having the same refractive index as that of the removed cladding. Replacing the solid-state cladding with the liquid enables the NSOM probe to reach the core-cladding interface without changing the boundary condition at the interface. The height of the probe immersed into the viscous liquid is done with the information from the surface profile of the naked core. The measured propagation characteristic shows a good agreement with the simulation result.
Keywords :
claddings; near-field scanning optical microscopy; optical waveguides; refractive index; NSOM-based characterization method; core-cladding interface; near-field scanning optical microscope; optical channel waveguide; refractive index; solid-state cladding; Boundary conditions; Optical materials; Optical microscopy; Optical propagation; Optical refraction; Optical variables control; Optical waveguides; Probes; Refractive index; Solid state circuits; Electric field measurement; microscopy; optical waveguides;
fLanguage :
English
Journal_Title :
Photonics Technology Letters, IEEE
Publisher :
ieee
ISSN :
1041-1135
Type :
jour
DOI :
10.1109/LPT.2005.844004
Filename :
1411896
Link To Document :
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