DocumentCode
752953
Title
TRASIM: compact and efficient two-dimensional transient simulator for arbitrary planar semiconductor devices
Author
Obrecht, Michael S. ; Elmasry, Mohamed I. ; Heasell, Edwin L.
Author_Institution
Dept. of Electr. & Comput. Eng., Waterloo Univ., Ont., Canada
Volume
14
Issue
4
fYear
1995
fDate
4/1/1995 12:00:00 AM
Firstpage
447
Lastpage
458
Abstract
A new software tool TRASIM (Two-Dimensional Transient Simulator) has been developed for arbitrary, planar semiconductor devices. A finite difference technique is employed with a modified, decoupled Gummel-like method. The memory requirements are reduced significantly compared to the conventionally used Newton-like methods. TRASIM exhibits a good stability and convergence rate, and user interaction with the computational process is significantly reduced. Low memory requirements and efficiency make the method attractive for the future 3-D applications. The software uses the drift-diffusion model, with up-to-date mobility and lifetime models. External RC-chains may be connected to device electrodes. Numerical examples are presented illustrating the advantages of the modified Gummel method over the Newton method, for transient simulation
Keywords
convergence of numerical methods; digital simulation; electronic engineering computing; finite difference methods; iterative methods; semiconductor device models; simulation; transient analysis; 2D simulator; 3D applications; TRASIM; arbitrary planar semiconductor devices; convergence rate; drift-diffusion model; finite difference technique; lifetime model; memory requirements reduction; mobility model; modified decoupled Gummel-like method; software tool; stability; two-dimensional transient simulator; Application software; Computational modeling; Convergence; Electron mobility; Finite difference methods; Newton method; Nonlinear equations; Semiconductor devices; Software tools; Stability;
fLanguage
English
Journal_Title
Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on
Publisher
ieee
ISSN
0278-0070
Type
jour
DOI
10.1109/43.372371
Filename
372371
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