• DocumentCode
    752996
  • Title

    Verification of Nyquist data converters using behavioral simulation

  • Author

    Liu, Edward ; Sangiovanni-Vincentelli, Alberto

  • Author_Institution
    Dept. of Electr. Eng. & Comput. Sci., California Univ., Berkeley, CA, USA
  • Volume
    14
  • Issue
    4
  • fYear
    1995
  • fDate
    4/1/1995 12:00:00 AM
  • Firstpage
    493
  • Lastpage
    502
  • Abstract
    A behavioral representation of Nyquist data converters is presented. The representation captures the static behavior of a memoryless Nyquist data converter including statistical variations. The variations are classified into noise and process variations according to how these nonidealities affect the converter behavior. To describe noise effects, a joint probability density function is used. To describe behavioral effects due to process variations, a Gaussian model is used. Using the behavioral representation, a novel strategy to calculate system performance is developed. The performance specifications of a converter, including offset error, full scale gain error, integral nonlinearity, differential nonlinearity, harmonic distortion, and signal-to-noise ratio, are calculated in two steps. First, the converter model parameters are extracted from the circuit. Then, the converter performance is computed using only the model parameters since the model captures the converter behavior. Experimental results agree well with SPICE simulations and confirm the validity of the model
  • Keywords
    SPICE; analogue-digital conversion; circuit analysis computing; digital-analogue conversion; errors; harmonic distortion; integrated circuit modelling; integrated circuit noise; probability; ADC; DAC; Gaussian model; Nyquist data converters; SNR; SPICE simulations; behavioral simulation; converter model parameters; differential nonlinearity; full scale gain error; harmonic distortion; integral nonlinearity; joint probability density function; memoryless data converter; noise effects; offset error; process variations; signal/noise ratio; static behavior; statistical variations; system performance; 1f noise; Circuit noise; Circuit simulation; Circuit synthesis; Computer errors; Hardware; Mathematical model; Probability density function; SPICE; System performance;
  • fLanguage
    English
  • Journal_Title
    Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0278-0070
  • Type

    jour

  • DOI
    10.1109/43.372375
  • Filename
    372375