DocumentCode :
752996
Title :
Verification of Nyquist data converters using behavioral simulation
Author :
Liu, Edward ; Sangiovanni-Vincentelli, Alberto
Author_Institution :
Dept. of Electr. Eng. & Comput. Sci., California Univ., Berkeley, CA, USA
Volume :
14
Issue :
4
fYear :
1995
fDate :
4/1/1995 12:00:00 AM
Firstpage :
493
Lastpage :
502
Abstract :
A behavioral representation of Nyquist data converters is presented. The representation captures the static behavior of a memoryless Nyquist data converter including statistical variations. The variations are classified into noise and process variations according to how these nonidealities affect the converter behavior. To describe noise effects, a joint probability density function is used. To describe behavioral effects due to process variations, a Gaussian model is used. Using the behavioral representation, a novel strategy to calculate system performance is developed. The performance specifications of a converter, including offset error, full scale gain error, integral nonlinearity, differential nonlinearity, harmonic distortion, and signal-to-noise ratio, are calculated in two steps. First, the converter model parameters are extracted from the circuit. Then, the converter performance is computed using only the model parameters since the model captures the converter behavior. Experimental results agree well with SPICE simulations and confirm the validity of the model
Keywords :
SPICE; analogue-digital conversion; circuit analysis computing; digital-analogue conversion; errors; harmonic distortion; integrated circuit modelling; integrated circuit noise; probability; ADC; DAC; Gaussian model; Nyquist data converters; SNR; SPICE simulations; behavioral simulation; converter model parameters; differential nonlinearity; full scale gain error; harmonic distortion; integral nonlinearity; joint probability density function; memoryless data converter; noise effects; offset error; process variations; signal/noise ratio; static behavior; statistical variations; system performance; 1f noise; Circuit noise; Circuit simulation; Circuit synthesis; Computer errors; Hardware; Mathematical model; Probability density function; SPICE; System performance;
fLanguage :
English
Journal_Title :
Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on
Publisher :
ieee
ISSN :
0278-0070
Type :
jour
DOI :
10.1109/43.372375
Filename :
372375
Link To Document :
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