DocumentCode
753243
Title
Relationships between common source, common gate, and common drain FETs
Author
Gao, Jianjun ; Boeck, Georg
Author_Institution
Radio Eng. Dept., Southeast Univ., Nanjing, China
Volume
53
Issue
12
fYear
2005
Firstpage
3825
Lastpage
3831
Abstract
This paper comprehensively analyzes the relationship between common source (CS), common gate (CG), and common drain (CD) field-effect transistors (FETs). The signal and noise parameters of the CG and CD configuration can be obtained directly by using a simple set of formulas from CS signal and noise parameters. All the relationships provide a bi-directional bridge for the transformation between CS, CG, and CD FETs. This technique is based on the combination of an equivalent-circuit model and conventional two-port network signal/noise correlation matrix technique. The derived relationships have universal validity, but they have been verified at 2×40 μm gatewidth (number of gate fingers × unit gatewidth) double-heterojunction δ-doped AlGaAs/InGaAs/GaAs pseudomorphic high electron-mobility transistor with 0.25-μm gate length. Good agreement has been obtained between calculated and measured results.
Keywords
III-V semiconductors; Schottky gate field effect transistors; aluminium compounds; equivalent circuits; gallium arsenide; high electron mobility transistors; indium compounds; semiconductor device noise; semiconductor doping; semiconductor heterojunctions; two-port networks; 0.25 micron; AlGaAs-InGaAs-GaAs; MESFET; bidirectional bridge; common drain FET; common gate FET; common source FET; equivalent-circuit model; field-effect transistor; gate fingers; gate length; noise parameter; pseudomorphic high electron-mobility transistor; signal parameter; signal/noise correlation matrix technique; two-port network; unit gatewidth; Bidirectional control; Bridge circuits; Character generation; FETs; HEMTs; Impedance; Indium gallium arsenide; Microwave transistors; Optical noise; PHEMTs; Common drain (CD); MESFET; common gate (CG); common source (CS); high electron-mobility transistor (HEMT); noise parameters;
fLanguage
English
Journal_Title
Microwave Theory and Techniques, IEEE Transactions on
Publisher
ieee
ISSN
0018-9480
Type
jour
DOI
10.1109/TMTT.2005.859863
Filename
1550034
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