Title :
Relationships between common source, common gate, and common drain FETs
Author :
Gao, Jianjun ; Boeck, Georg
Author_Institution :
Radio Eng. Dept., Southeast Univ., Nanjing, China
Abstract :
This paper comprehensively analyzes the relationship between common source (CS), common gate (CG), and common drain (CD) field-effect transistors (FETs). The signal and noise parameters of the CG and CD configuration can be obtained directly by using a simple set of formulas from CS signal and noise parameters. All the relationships provide a bi-directional bridge for the transformation between CS, CG, and CD FETs. This technique is based on the combination of an equivalent-circuit model and conventional two-port network signal/noise correlation matrix technique. The derived relationships have universal validity, but they have been verified at 2×40 μm gatewidth (number of gate fingers × unit gatewidth) double-heterojunction δ-doped AlGaAs/InGaAs/GaAs pseudomorphic high electron-mobility transistor with 0.25-μm gate length. Good agreement has been obtained between calculated and measured results.
Keywords :
III-V semiconductors; Schottky gate field effect transistors; aluminium compounds; equivalent circuits; gallium arsenide; high electron mobility transistors; indium compounds; semiconductor device noise; semiconductor doping; semiconductor heterojunctions; two-port networks; 0.25 micron; AlGaAs-InGaAs-GaAs; MESFET; bidirectional bridge; common drain FET; common gate FET; common source FET; equivalent-circuit model; field-effect transistor; gate fingers; gate length; noise parameter; pseudomorphic high electron-mobility transistor; signal parameter; signal/noise correlation matrix technique; two-port network; unit gatewidth; Bidirectional control; Bridge circuits; Character generation; FETs; HEMTs; Impedance; Indium gallium arsenide; Microwave transistors; Optical noise; PHEMTs; Common drain (CD); MESFET; common gate (CG); common source (CS); high electron-mobility transistor (HEMT); noise parameters;
Journal_Title :
Microwave Theory and Techniques, IEEE Transactions on
DOI :
10.1109/TMTT.2005.859863