DocumentCode :
753252
Title :
Millimeter-wave substrate integrated waveguides and filters in photoimageable thick-film technology
Author :
Stephens, Daniel ; Young, Paul R. ; Robertson, Ian D.
Author_Institution :
Microwave Syst. Res. Group, Univ. of Surrey, UK
Volume :
53
Issue :
12
fYear :
2005
Firstpage :
3832
Lastpage :
3838
Abstract :
This paper presents the design and fabrication of substrate-integrated waveguides and filters for use at millimeter-wave frequencies. The components described are fabricated using photoimageable thick-film materials. Measurements on V- and W-band waveguide-to-microstrip transitions are presented. Losses resulting from the reduced-height nature of the waveguides are extracted from thru-relect-line calibration standards illustrating the effect of current losses in the broadwalls of the waveguides. The design of fourth-order 0.01-dB ripple Chebyshev resonant cavity filters operating at V-, W-, D-, and G-band is presented. The measured results of all components are in excellent agreement with simulated predictions.
Keywords :
Chebyshev filters; cavity resonator filters; microstrip transitions; millimetre wave filters; thick films; 0.01 dB; current loss; fouth-order Chebyshev resonant cavity filter; millimeter-wave frequency; photoimageable thick-film material; photoimageable thick-film technology; substrate integrated filter; substrate integrated waveguide; thru-relect-line calibration standards; waveguide-to-microstrip transition; Calibration; Chebyshev approximation; Filters; Frequency; Millimeter wave measurements; Millimeter wave technology; Optical device fabrication; Predictive models; Resonance; Waveguide transitions; Ceramics; filters; millimeter waves; substrate integrated waveguides (SIWs); thick-film technology;
fLanguage :
English
Journal_Title :
Microwave Theory and Techniques, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9480
Type :
jour
DOI :
10.1109/TMTT.2005.859862
Filename :
1550035
Link To Document :
بازگشت