Analysis of the phase noise in saturated SOAs for DPSK applications

Author

Wei, Xing ; Zhang, Liming

Author_Institution

Lucent Technol., Bell Labs., Murray Hill, NJ, USA

Volume

41

Issue

4

fYear

2005

fDate

4/1/2005 12:00:00 AM

Firstpage

554

Lastpage

561

Abstract

A theoretical model is used to analyze the impact of phase noise on the performance of semiconductor optical amplifiers (SOAs) in the saturation regime for differential phase-shift keying (DPSK) applications. It is found that the variance of the differential phase error scales as T²/τ_c² for τ_c≫T, where T is the bit period and τ_c is the carrier lifetime of the SOA. This suggests that the adverse effect of saturation-induced phase noise can be significantly reduced by increasing the bit rate or the carrier lifetime.

Keywords

carrier lifetime; differential phase shift keying; optical communication equipment; optical modulation; phase noise; semiconductor device models; semiconductor device noise; semiconductor optical amplifiers; DPSK; bit rate; carrier lifetime; differential phase error; differential phase-shift keying; phase noise; saturated SOA; semiconductor optical amplifiers; Charge carrier lifetime; Differential phase shift keying; Differential quadrature phase shift keying; Noise generators; Optical crosstalk; Optical distortion; Optical noise; Optical saturation; Phase noise; Semiconductor optical amplifiers; Charge carrier lifetime; differential phase-shift keying (DPSK); semiconductor optical amplifier (SOA);

fLanguage

English

Journal_Title

Quantum Electronics, IEEE Journal of

Publisher

ieee

ISSN

0018-9197

Type

jour

DOI

10.1109/JQE.2005.843943

Filename

1411959