DocumentCode :
753788
Title :
A test of the exponential MTBF and comparison of power functions of the random censoring case
Author :
Kim, Jee Soo
Author_Institution :
GTE Labs. Inc., Waltham, MA, USA
Volume :
37
Issue :
1
fYear :
1988
fDate :
4/1/1988 12:00:00 AM
Firstpage :
103
Lastpage :
107
Abstract :
A hypothesis test procedure is given for testing the parameter of an exponential distribution when the reliability data are randomly censored. The effects of the severity of the censoring are studied with respect to the power functions of the test. Some remarks are made on the inadequacy of the Epstein type of testing procedure in the random censoring case
Keywords :
failure analysis; reliability theory; statistical analysis; Epstein testing procedure; MTBF; exponential distribution; hypothesis test procedure; power functions; random censoring case; reliability data; Computer aided software engineering; Exponential distribution; Hardware; Laboratories; Random variables; Reliability theory; Software reliability; Statistical analysis; Statistical distributions; Testing;
fLanguage :
English
Journal_Title :
Reliability, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9529
Type :
jour
DOI :
10.1109/24.3725
Filename :
3725
Link To Document :
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