Title :
The measurement and prediction of proton upset
Author :
Shimano, Y. ; Goka, T. ; Kuboyama, S. ; Kawachi, K. ; Kanai, T. ; Takami, Y.
Author_Institution :
Tsukuba Space Center, Japan
fDate :
12/1/1989 12:00:00 AM
Abstract :
The authors evaluate tolerance to proton upset for three kinds of memories and one microprocessor unit for space use by irradiating them with high-energy protons up to nearly 70 MeV. They predict the error rates of these memories using a modified semi-empirical equation of W.L. Bendel and E.L. Petersen (1983). A two-parameter method was used instead of Bendel´s one-parameter method. There is a large difference between these two methods with regard to the fitted parameters. The calculation of upset rates in orbits were carried out using these parameters and NASA AP8MAC, AP8MIC. For the 93419 RAM the result of this calculation was compared with the in-orbit data taken on the MOS-1 spacecraft. A good agreement was found between the two sets of upset-rate data
Keywords :
aerospace instrumentation; environmental testing; integrated circuit testing; integrated memory circuits; microprocessor chips; proton effects; radiation hardening (electronics); random-access storage; 70 MeV; 93419 RAM; AP8MAC; AP8MIC; MOS-1 spacecraft; high-energy protons; in-orbit data; microprocessor unit; prediction of proton upset; semi-empirical equation; space use; tolerance to proton upset; two-parameter method; upset rates; upset-rate data; Acceleration; Atomic measurements; Cyclotrons; Degradation; Equations; Error analysis; Particle beams; Protons; Random access memory; Space vehicles;
Journal_Title :
Nuclear Science, IEEE Transactions on
