Title :
EMI conducted emission in the differential mode emanating from an SCR: phenomena and noise level prediction
Author :
Scheich, Roland ; Roudet, James
Author_Institution :
ABB Henschel AG, Mannheim, Germany
fDate :
3/1/1995 12:00:00 AM
Abstract :
This paper deals with an EMC analysis of a power converter. In particular, the phenomena and modeling of conducted noise emission caused by an SCR (silicon controlled rectifier) are described. Theoretical results in the time as well as frequency domain are discussed and compared to the time signal measured and its spectrum
Keywords :
electromagnetic compatibility; electromagnetic interference; frequency-domain analysis; thyristor convertors; time-domain analysis; EMC analysis; EMI conducted emission; SCR; conducted noise emission; differential mode; frequency domain analysis; noise level prediction; power converter; silicon controlled rectifier; time domain analysis; time signal spectrum; Circuit noise; Electromagnetic compatibility; Electromagnetic interference; Electromagnetic radiation; Frequency; Noise level; Rectifiers; Semiconductor device noise; Thyristors; Voltage;
Journal_Title :
Power Electronics, IEEE Transactions on
