Incorporating Large-Scale FPAAs Into Analog Design and Test Courses

Author

Twigg, Christopher M. ; Hasler, Paul E.

Author_Institution

Dept. of Electr. & Comput. Eng., Binghamton Univ., Binghamton, NY

Volume

51

Issue

3

fYear

2008

Firstpage

319

Lastpage

324

Abstract

The development of large-scale field-programmable analog arrays (FPAAs) provides an excellent opportunity for expanding the capabilities of analog design courses and their laboratories. These devices allow the complete design and test cycle of an analog IC to be explored within the span of a single-term course without being limited to prefabricated integrated circuits. A brief discussion of the authors´ experience in incorporating the reconfigurable analog signal processor (RASP) into courses and workshops is presented.

Keywords

analogue integrated circuits; field programmable analogue arrays; analog design; analog integrated circuit; field-programmable analog arrays; large-scale FPAA; prefabricated integrated circuits; reconfigurable analog signal processor; test courses; Analog integrated circuits; Circuit testing; Fabrication; Field programmable analog arrays; Integrated circuit layout; Integrated circuit testing; Laboratories; Large-scale systems; Performance evaluation; System-on-a-chip; Analog design; analog test; field-programmable analog array (FPAA); laboratory; reconfigurable analog;

fLanguage

English

Journal_Title

Education, IEEE Transactions on

Publisher

ieee

ISSN

0018-9359

Type

jour

DOI

10.1109/TE.2008.916762

Filename

4544801