• DocumentCode
    754203
  • Title

    Regularization Techniques for Extracting OSNR From Low Resolution WDM Channel Monitors

  • Author

    Li, Mei ; Pendock, Graeme J. ; Evans, Robin J.

  • Author_Institution
    Dept. of Electr. Eng., Univ. of Melbourne, Parkville, VIC
  • Volume
    27
  • Issue
    9
  • fYear
    2009
  • fDate
    5/1/2009 12:00:00 AM
  • Firstpage
    1162
  • Lastpage
    1171
  • Abstract
    Channel monitors that are based on scanning the wavelength division multiplexing (WDM) spectrum with a tunable filter must have sufficient resolution to resolve the ASE floor between channels to enable the OSNRs to be determined. If the bandwidth of the scanning filter is too broad then adjacent channels in the measurement become smeared together thus obscuring this level of ASE. However, in practice it is desirable to use as broad a filter as possible since this will increase mechanical robustness and reduce cost. In this paper, we describe and experimentally demonstrate a signal processing technique that can successfully extract the OSNR out of such smeared measured spectra. Such inverse problems are notoriously ill-posed. To deal with this our technique employs two stages of Tikhonov regularization and uses the known spectral response of the scanning filter together with the knowledge of the expected spectral structure of a single channel. As with all ill-posed inverse problems it can be expected that the extracted OSNR would be extremely sensitive to measurement errors and inaccuracies in the known filter and expected channel shapes. We investigate the sensitivities in OSNR to such errors and our results show the technique to be fairly robust, yielding uncertainties in OSNR below 1 dB over a wide range of realistic system noise levels and spectral variations.
  • Keywords
    inverse problems; optical filters; signal processing; superradiance; wavelength division multiplexing; Tikhonov regularization; WDM; channel monitors; inverse problems; regularization techniques; scanning filter; signal processing technique; spectral structure; spectral variations; system noise levels; tunable filter; wavelength division multiplexing spectrum; Bandwidth; Costs; Filters; Inverse problems; Optical noise; Robustness; Signal processing; Signal to noise ratio; Wavelength division multiplexing; Wavelength measurement; Amplifier noise; inverse problems; least squares methods; monitoring; optical filters; optical spectroscopy; spectral analysis; wavelength division multiplexing (WDM);
  • fLanguage
    English
  • Journal_Title
    Lightwave Technology, Journal of
  • Publisher
    ieee
  • ISSN
    0733-8724
  • Type

    jour

  • DOI
    10.1109/JLT.2008.929423
  • Filename
    4840611