Title :
Analysis of substrate coupling by means of a stochastic method
Author :
Maffezzoni, Paolo ; Maffezzoni, Paolo
Author_Institution :
Dipt. di Elettronica e Informazione, Politecnico di Milano, Italy
fDate :
6/1/2002 12:00:00 AM
Abstract :
The paper addresses the problem of modeling the coupling effects that take place in resistive IC substrates for accurate and efficient circuit analysis. The proposed method is based on a suited extension of the floating random walk algorithm that can deal with mixed Dirichlet and Neumann boundary conditions.
Keywords :
integrated circuit modelling; stochastic processes; substrates; floating random walk algorithm; mixed Dirichlet/Neumann boundary conditions; modeling; resistive IC substrates; stochastic method; substrate coupling; Boundary conditions; Conductivity; Contacts; Coupling circuits; Electric potential; Electrostatics; Geometry; Green function; Stochastic processes; Surface resistance;
Journal_Title :
Electron Device Letters, IEEE
DOI :
10.1109/LED.2002.1004232
