DocumentCode :
754291
Title :
A quasi-analytical SET model for few electron circuit simulation
Author :
Mahapatra, Santanu ; Ionescu, Adrian Mihai ; Banerjee, Kaustav
Author_Institution :
Electron. Lab., Swiss Fed. Inst. of Technol., Lausanne, Switzerland
Volume :
23
Issue :
6
fYear :
2002
fDate :
6/1/2002 12:00:00 AM
Firstpage :
366
Lastpage :
368
Abstract :
A novel quasi-analytical model for single electron transistors (SETS) is proposed and validated by comparison with Monte-Carlo (MC) simulations in terms of drain current and transconductance. The new approach is based on the separate modeling of the tunneling and thermal components of the drain current, and verified over two decades of temperature. The model parameters are physical and an associated parameter extraction procedure is also reported. The model is shown to be accurate for SET logic circuit simulation in both static and dynamic regimes and is attractive for hybrid (SET-CMOS) circuit co-simulation.
Keywords :
Monte Carlo methods; circuit simulation; leakage currents; logic simulation; semiconductor device models; single electron transistors; Monte-Carlo simulations; drain current; dynamic regimes; few electron circuit simulation; hybrid circuit cosimulation; logic circuit simulation; parameter extraction; quasi-analytical model; single electron transistors; static regimes; temperature dependent leakage current; Algorithms; Analytical models; Capacitance; Circuit simulation; Logic circuits; Parameter extraction; Single electron transistors; Temperature distribution; Tunneling; Voltage;
fLanguage :
English
Journal_Title :
Electron Device Letters, IEEE
Publisher :
ieee
ISSN :
0741-3106
Type :
jour
DOI :
10.1109/LED.2002.1004237
Filename :
1004237
Link To Document :
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