DocumentCode :
75439
Title :
Effect of Quantum Barrier Thickness in the Multiple-Quantum-Well Active Region of GaInN/GaN Light-Emitting Diodes
Author :
Guan-Bo Lin ; Dong-Yeong Kim ; Qifeng Shan ; Jaehee Cho ; Schubert, E. Fred ; Hyunwook Shim ; Cheolsoo Sone ; Jong Kyu Kim
Author_Institution :
Dept. of Electr., Comput., & Syst., Eng., Rensselaer Polytech. Inst., Troy, NY, USA
Volume :
5
Issue :
4
fYear :
2013
fDate :
Aug. 2013
Firstpage :
1600207
Lastpage :
1600207
Abstract :
The dependence of the polarization-induced electric field in GaInN/GaN multiple-quantum-well light-emitting diodes (LEDs) on the GaN quantum barrier (QB) thickness is investigated. Electrostatic arguments and simulations predict that a thin QB thickness reduces the electric field in the quantum wells (QWs) and also improves the LED efficiency. We experimentally demonstrate that the QW electric field decreases with decreasing QB thickness. The lower electric field results in a better overlap of electron and hole wave functions and better carrier confinement in the QWs. A reduced efficiency droop and enhanced internal quantum efficiency is demonstrated for GaInN/GaN LEDs when the QB thickness is reduced from 24.5 to 9.1 nm.
Keywords :
III-V semiconductors; electrostatics; gallium compounds; indium compounds; light emitting diodes; light polarisation; semiconductor quantum wells; wide band gap semiconductors; GaInN-GaN; LED; QW electric field; carrier confinement; efficiency droop; electron wave function; electrostatics; hole wave function; internal quantum efficiency; light-emitting diodes; multiple-quantum-well active region; polarization-induced electric field; quantum barrier thickness; Electric fields; Epitaxial growth; Gallium nitride; Light emitting diodes; Quantum well devices; Thickness measurement; Light emitting diode; efficiency droop; gallium nitride;
fLanguage :
English
Journal_Title :
Photonics Journal, IEEE
Publisher :
ieee
ISSN :
1943-0655
Type :
jour
DOI :
10.1109/JPHOT.2013.2276758
Filename :
6576153
Link To Document :
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