• DocumentCode
    754391
  • Title

    Improved Emission Efficiency in InGaN Light-Emitting Diodes Using Reverse Bias in Pulsed Voltage Operation

  • Author

    Cho, Jaehee ; Yoon, Euijoon ; Kim, Hyunsoo ; Park, YongJo ; Kwak, Joon Seop

  • Author_Institution
    Dept. of Mater. Sci. & Eng., Seoul Nat. Univ., Seoul
  • Volume
    20
  • Issue
    13
  • fYear
    2008
  • fDate
    7/1/2008 12:00:00 AM
  • Firstpage
    1190
  • Lastpage
    1192
  • Abstract
    Improved emission efficiency in InGaN near-ultraviolet light-emitting diodes (LEDs) was demonstrated using reverse bias in pulsed voltage operation. Pulsed voltage operation of the LEDs from 3 to 3.2 V with a duty cycle of 50% at Hz produced a radiant flux of 4.0 mW, while pulsed operation from 0 to 3.2 V showed a radiant flux of 3.2 mW. The radiant flux further increased as the reverse voltage increased, at the same forward voltage. The improved radiant flux was attributed to uniform carrier redistribution at the multiquantum wells, due to a periodically applied voltage from reverse voltage to forward voltage with a frequency ranged from to Hz, resulting in improved emission efficiency in InGaN LEDs.
  • Keywords
    III-V semiconductors; indium compounds; light emitting diodes; InGaN; light-emitting diode emission; near-ultraviolet light-emitting diode; pulsed voltage operation; radiant flux; voltage 0 V to 3.2 V; Charge carrier processes; Electron emission; Frequency; Light emitting diodes; Materials science and technology; Pulse measurements; Quantum well devices; Radiative recombination; Spontaneous emission; Voltage; GaN; light-emitting diode (LED);
  • fLanguage
    English
  • Journal_Title
    Photonics Technology Letters, IEEE
  • Publisher
    ieee
  • ISSN
    1041-1135
  • Type

    jour

  • DOI
    10.1109/LPT.2008.924893
  • Filename
    4544831