• DocumentCode
    754420
  • Title

    Novel silicon-on-insulator structures for reduced self-heating effects

  • Author

    Chu, Paul K.

  • Volume
    5
  • Issue
    4
  • fYear
    2005
  • Firstpage
    18
  • Lastpage
    29
  • Keywords
    Charge carrier processes; Electric resistance; MOSFETs; Medical simulation; Poisson equations; Silicon on insulator technology; Temperature; Thermal conductivity; Thermal expansion; Thermal resistance;
  • fLanguage
    English
  • Journal_Title
    Circuits and Systems Magazine, IEEE
  • Publisher
    ieee
  • ISSN
    1531-636X
  • Type

    jour

  • DOI
    10.1109/MCAS.2005.1550166
  • Filename
    1550166