DocumentCode :
754769
Title :
Test Data Compression Based on Variable-to-Variable Huffman Encoding With Codeword Reusability
Author :
Kavousianos, Xrysovalantis ; Kalligeros, Emmanouil ; Nikolos, Dimitris
Author_Institution :
Dept. of Comput. Sci., Ioannina Univ., Ioannina
Volume :
27
Issue :
7
fYear :
2008
fDate :
7/1/2008 12:00:00 AM
Firstpage :
1333
Lastpage :
1338
Abstract :
A new statistical test data compression method that is suitable for IP cores of an unknown structure with multiple scan chains is proposed in this paper. Huffman, which is a well-known fixed-to-variable code, is used in this paper as a variable-to-variable code. The precomputed test set of a core is partitioned into variable-length blocks, which are, then, compressed by an efficient Huffman-based encoding procedure with a limited number of codewords. To increase the compression ratio, the same codeword can be reused for encoding compatible blocks of different sizes. Further compression improvements can be achieved by using two very simple test set transformations. A simple and low-overhead decompression architecture is also proposed.
Keywords :
Huffman codes; data compression; codeword reusability; compression ratio; data compression; fixed-to-variable code; low-overhead decompression architecture; multiple scan chains; variable-to-variable Huffman encoding; variable-to-variable code; Circuit testing; Computer architecture; Computer science; Encoding; Hardware; Intellectual property; System testing; System-on-a-chip; Systems engineering and theory; Test data compression; Embedded testing techniques; Huffman encoding; intellectual property (IP) cores; test data compression;
fLanguage :
English
Journal_Title :
Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on
Publisher :
ieee
ISSN :
0278-0070
Type :
jour
DOI :
10.1109/TCAD.2008.923100
Filename :
4544866
Link To Document :
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